Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6656834 | Method of selectively alloying interconnect regions by deposition process | Paul R. Besser | 2003-12-02 |
| 6633085 | Method of selectively alloying interconnect regions by ion implantation | Paul R. Besser, Donggang D. Wu | 2003-10-14 |
| 6600333 | Method and test structure for characterizing sidewall damage in a semiconductor device | Jeremy I. Martin, Nicholas J. Kepler | 2003-07-29 |