Issued Patents 2003
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6664532 | Method of precision calibration of magnification of scanning microscopes with the use of test diffraction grating | Arkady Nikitin | 2003-12-16 |
| 6661007 | Method of diagnosing magnification, linearity and stability of scanning electron microscope | Albert Sicignano, Tim Goldburt | 2003-12-09 |
| 6608294 | Simple method of precision calibration of magnification of a scanning microscopes with the use of test diffraction grating | Arkady Nikitin | 2003-08-19 |
| 6596993 | Method of automatically correcting magnification and non-linearity of scanning electron microscope | Albert Sicignano, Tim Goldburt | 2003-07-22 |
| 6573500 | Method of precision calibration of magnification of a scanning microscope with the use of test diffraction grating | Arkady Nikitin | 2003-06-03 |