Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6531707 | Machine vision method for the inspection of a material for defects | Patrice Favreau, Jeffrey Wolinsky | 2003-03-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6531707 | Machine vision method for the inspection of a material for defects | Patrice Favreau, Jeffrey Wolinsky | 2003-03-11 |