Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6584231 | System and method for selective grayscale compression for defect images | Sherrill E. Lavagnino | 2003-06-24 |
| 6531707 | Machine vision method for the inspection of a material for defects | Patrice Favreau, Markku E. Jaaskelainen | 2003-03-11 |