Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6671398 | Method and apparatus for inspection of patterned semiconductor wafers | Gilad Almogy | 2003-12-30 |
| 6587194 | Method of and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2003-07-01 |
| 6556294 | Method of and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2003-04-29 |