Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6649075 | Method and apparatus for measuring etch uniformity of a semiconductor wafer | Leonid Poslavsky, Jennifer Leigh Lewis | 2003-11-18 |
MB
Melisa Buie
Overall (2003): #159,817 of 273,478Top 60%
1
Patents 2003