MW

Mike Whelan

Lam Research: 1 patents #49 of 158Top 35%
📍 Coppell, TX: #15 of 38 inventorsTop 40%
🗺 Texas: #2,440 of 8,590 inventorsTop 30%
Overall (2002): #149,859 of 266,432Top 60%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6432729 Method for characterization of microelectronic feature quality Randall S. Mundt, Albert Lamm, Andrew Weeks Kueny 2002-08-13