RM

Randall S. Mundt

Lam Research: 1 patents #49 of 158Top 35%
📍 Houston, TX: #354 of 1,272 inventorsTop 30%
🗺 Texas: #2,440 of 8,590 inventorsTop 30%
Overall (2002): #135,193 of 266,432Top 55%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6432729 Method for characterization of microelectronic feature quality Albert Lamm, Mike Whelan, Andrew Weeks Kueny 2002-08-13