FS

Fred E. Stanke

SI Sensys Instruments: 1 patents #1 of 2Top 50%
📍 San Jose, CA: #851 of 2,494 inventorsTop 35%
🗺 California: #8,284 of 26,763 inventorsTop 35%
Overall (2002): #219,142 of 266,432Top 85%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6340602 Method of measuring meso-scale structures on wafers Kenneth C. Johnson 2002-01-22