Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6480286 | Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus | Keishi Kubo, Yukio Imada, Hiroyuki Takeuchi, Koji Handa | 2002-11-12 |
| 6445025 | Semiconductor memory device and manufacturing method thereof | Kazufumi Suenaga, Kiyoshi Ogata, Kazuhiko Horikoshi, Jun Tanaka, Hisayuki Kato +1 more | 2002-09-03 |