Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6480286 | Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus | Keiichi Yoshizumi, Yukio Imada, Hiroyuki Takeuchi, Koji Handa | 2002-11-12 |