TY

Takehiro Yamaoka

SI Seiko Instruments: 1 patents #121 of 259Top 50%
Overall (2002): #106,569 of 266,432Top 40%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6405583 Correlation sample for scanning probe microscope and method of processing the correlation sample Yoshiharu Shirakawabe, Hiroshi Takahashi, Nobuhiro Shimizu 2002-06-18