Issued Patents 2002
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6469293 | Multiprobe and scanning probe microscope | Hiroshi Takahashi, Yoshiharu Shirakawabe, Chiaki Yasumuro, Tadashi Arai | 2002-10-22 |
| 6422069 | Self-exciting and self-detecting probe and scanning probe apparatus | Yoshiharu Shirakawabe, Hiroshi Takahashi, Chiaki Yasumuro, Tadashi Arai | 2002-07-23 |
| 6405583 | Correlation sample for scanning probe microscope and method of processing the correlation sample | Yoshiharu Shirakawabe, Hiroshi Takahashi, Takehiro Yamaoka | 2002-06-18 |
| 6388252 | Self-detecting type of SPM probe and SPM device | Hiroshi Takahashi, Yoshiharu Shirakawabe, Michel Despont | 2002-05-14 |
| 6383823 | Probe for scanning probe microscope (SPM) and SPM device | Hiroshi Takahashi, Yoshiharu Shirakawabe | 2002-05-07 |
| 6358426 | Method of fabricating probe force atomic force microscope | Hiroshi Muramatsu | 2002-03-19 |