Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6388249 | Surface analyzing apparatus | Naohiko Fujino | 2002-05-14 |
| 6355495 | Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof | Naohiko Fujino, Isamu Karino, Masahi Ohmori, Masatoshi Yasutake | 2002-03-12 |