Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6423556 | Method for evaluating impurity concentrations in heat treatment furnaces | Douglas G. Anderson | 2002-07-23 |
| 6346460 | Low cost silicon substrate with impurity gettering and latch up protection and method of manufacture | Oleg Kononchuk | 2002-02-12 |
| 6339011 | Method of forming semiconductive active area having a proximity gettering region therein and method of processing a monocrystalline silicon substrate to have a proximity gettering region | Fernando Gonzalez | 2002-01-15 |