YC

Yoel Cohen

NI Nova Measuring Instruments: 1 patents #5 of 12Top 45%
Overall (2002): #86,977 of 266,432Top 35%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6424417 Method and system for controlling the photolithography process Moshe Finarov 2002-07-23