Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6381303 | X-ray microanalyzer for thin films | Boris Yokhin, Isaac Mazor, Amos Gvirtzman | 2002-04-30 |
| 6351516 | Detection of voids in semiconductor wafer processing | Isaac Mazor | 2002-02-26 |