Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6453002 | Differential measurement of X-ray microfluorescence | Boris Yokhin, David Bar-On | 2002-09-17 |
| 6389102 | X-ray array detector | Amos Gvirtzman, Boris Yokhin, Ami Dovrat | 2002-05-14 |
| 6381303 | X-ray microanalyzer for thin films | Long Vu, Boris Yokhin, Amos Gvirtzman | 2002-04-30 |
| 6351516 | Detection of voids in semiconductor wafer processing | Long Vu | 2002-02-26 |