Issued Patents 2002
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6486493 | Semiconductor integrated circuit device having hierarchical test interface circuit | Kazutami Arimoto | 2002-11-26 |
| 6487105 | Test circuit for semiconductor integrated circuit which detects an abnormal contact resistance | Toshinori Morihara | 2002-11-26 |
| 6483139 | Semiconductor memory device formed on semiconductor substrate | Kazutami Arimoto | 2002-11-19 |
| 6477108 | Semiconductor device including memory with reduced current consumption | Kazutami Arimoto | 2002-11-05 |
| 6459113 | Semiconductor integrated circuit device and method of manufacturing the same, and cell size calculation method for DRAM memory cells | Toshinori Morihara, Kazutami Arimoto | 2002-10-01 |
| 6456560 | Semiconductor integrated circuit device with test interface circuit for performing test on embedded memory from outside | Kazutami Arimoto | 2002-09-24 |
| 6452859 | Dynamic semiconductor memory device superior in refresh characteristics | Katsumi Dosaka, Kazutami Arimoto | 2002-09-17 |
| 6449204 | DYNAMIC SEMICONDUCTOR MEMORY DEVICE CAPABLE OF REARRANGING DATA STORAGE FROM A ONE BIT/ONE CELL SCHEME IN A NORMAL MODE TO A ONE BIT/TWO CELL SCHEME IN A TWIN-CELL MODE FOR LENGTHENING A REFRESH INTERVAL | Kazutami Arimoto, Takeshi Fujino, Takeshi Hashizume | 2002-09-10 |
| 6429495 | Semiconductor device with address programming circuit | Tsukasa Ooishi, Shigeki Tomishima | 2002-08-06 |
| 6418075 | Semiconductor merged logic and memory capable of preventing an increase in an abnormal current during power-up | Kazutami Arimoto, Yasuhiro Ishizuka, Seizou Furubeppu, Hiroki Sugano | 2002-07-09 |
| 6414890 | Semiconductor memory device capable of reliably performing burn-in test at wafer level | Kazutami Arimoto | 2002-07-02 |
| 6404684 | Test interface circuit and semiconductor integrated circuit device including the same | Kazutami Arimoto | 2002-06-11 |
| 6400625 | Semiconductor integrated circuit device capable of performing operational test for contained memory core at operating frequency higher than that of memory tester | Kazutami Arimoto, Katsumi Dosaka | 2002-06-04 |
| 6400628 | Semiconductor memory device | Katsumi Dosaka, Hiroki Sugano, Kazutami Arimoto | 2002-06-04 |
| 6388929 | Semiconductor memory device performing redundancy repair based on operation test and semiconductor integrated circuit device having the same | Kazutami Arimoto | 2002-05-14 |
| 6377483 | Semiconductor memory device having improved memory cell and bit line pitch | Kazutami Arimoto, Toshinori Morihara | 2002-04-23 |