| 6469944 |
Method of compensating for a defect within a semiconductor device |
Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more |
2002-10-22 |
| 6452846 |
Driver circuit for a voltage-pulling device |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more |
2002-09-17 |
| 6445629 |
Method of stressing a memory device |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more |
2002-09-03 |
| 6418071 |
Method of testing a memory cell |
Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more |
2002-07-09 |
| 6353564 |
Method of testing a memory array |
Kurt D. Beigel, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more |
2002-03-05 |
| 6335888 |
Margin-range apparatus for a sense amp's voltage-pulling transistor |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, James E. Miller, Daryl L. Habersetzer +2 more |
2002-01-01 |
