MM

Manny K. F. Ma

Micron: 15 patents #47 of 829Top 6%
📍 Boise, ID: #19 of 534 inventorsTop 4%
🗺 Idaho: #27 of 989 inventorsTop 3%
Overall (2002): #551 of 266,432Top 1%
15
Patents 2002

Issued Patents 2002

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
6472893 Test socket and methods Chris G. Martin 2002-10-29
6469944 Method of compensating for a defect within a semiconductor device Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2002-10-22
6452846 Driver circuit for a voltage-pulling device Kurt D. Beigel, Douglas J. Cutter, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more 2002-09-17
6445629 Method of stressing a memory device Kurt D. Beigel, Douglas J. Cutter, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more 2002-09-03
6444577 Method of fabricating a semiconductor device having increased breakdown voltage 2002-09-03
6442101 Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts Brian M. Shirley 2002-08-27
6434059 Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts Brian M. Shirley 2002-08-13
6418071 Method of testing a memory cell Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2002-07-09
6365937 Electrostatic discharge protection device having a graded junction Stephen R. Porter, Stephen L. Casper, Kevin G. Duesman 2002-04-02
6356250 Matrix addressable display with electrostatic discharge protection David A. Cathey, Glen E. Hush, Craig M. Dunham, David Zimlich 2002-03-12
6355508 Method for forming electrostatic discharge protection device having a graded junction Stephen R. Porter, Stephen L. Casper, Kevin G. Duesman 2002-03-12
6353564 Method of testing a memory array Kurt D. Beigel, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce +1 more 2002-03-05
6350634 Semiconductor device having a built-in heat sink and process of manufacturing same 2002-02-26
6340896 Test socket and methods Chris G. Martin 2002-01-22
6335888 Margin-range apparatus for a sense amp's voltage-pulling transistor Kurt D. Beigel, Douglas J. Cutter, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +2 more 2002-01-01