Issued Patents 2002
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6500255 | Process for growing silicon crystals which allows for variability in the process conditions while suppressing the formation of agglomerated intrinsic point defects | Vladimir V. Voronkov, Paolo Mutti | 2002-12-31 |
| 6432197 | Process for the preparation of non-oxygen precipitating Czochralski silicon wafers | — | 2002-08-13 |
| 6416836 | Thermally annealed, low defect density single crystal silicon | Martin Jeffrey Binns, Alan Wang | 2002-07-09 |
| 6409827 | Low defect density silicon and a process for producing low defect density silicon wherein V/G0 is controlled by controlling heat transfer at the melt/solid interface | Joseph C. Holzer | 2002-06-25 |
| 6391662 | Process for detecting agglomerated intrinsic point defects by metal decoration | Luciano Mule′Stagno | 2002-05-21 |
| 6361619 | Thermally annealed wafers having improved internal gettering | Martin Jeffrey Binns, Harold W. Korb | 2002-03-26 |
| 6342725 | Silicon on insulator structure having a low defect density handler wafer and process for the preparation thereof | — | 2002-01-29 |
| 6336968 | Non-oxygen precipitating czochralski silicon wafers | — | 2002-01-08 |