Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6341521 | Process and device for measuring the amount of impurities in a gas sample to be analyzed | Jean-Marc Girard, Patrick Mauvais, James McAndrew | 2002-01-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6341521 | Process and device for measuring the amount of impurities in a gas sample to be analyzed | Jean-Marc Girard, Patrick Mauvais, James McAndrew | 2002-01-29 |