Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445199 | Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures | Akella V. S. Satya, Brian C. Leslie, Robert Long, Neil Richardson, Bin-Ming Benjamin Tsai | 2002-09-03 |
| 6433561 | Methods and apparatus for optimizing semiconductor inspection tools | Akella V. S. Satya, Robert Long, Bin-Ming Benjamin Tsai, Brian C. Leslie | 2002-08-13 |