Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6429672 | Contamination-tolerant electrical test probe | Yuet-Ying Yu | 2002-08-06 |
| 6391669 | Embedded structures to provide electrical testing for via to via and interface layer alignment as well as for conductive interface electrical integrity in multilayer devices | Benjamin V. Fasano, Hai P. Longworth, Vincent P. Peterson, Anthony L. Plachy | 2002-05-21 |