Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6401000 | Fraction defective estimating method and system for estimating an assembly fraction defective of an article | Tatsuya Suzuki, Seii Miyakawa, Masaaki Asano, Takashi Kubota | 2002-06-04 |