SM

Seii Miyakawa

HI Hitachi: 1 patents #1,533 of 3,950Top 40%
Overall (2002): #120,216 of 266,432Top 50%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6401000 Fraction defective estimating method and system for estimating an assembly fraction defective of an article Tatsuya Suzuki, Toshijiro Ohashi, Masaaki Asano, Takashi Kubota 2002-06-04