Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6488409 | X-ray detector image quality test techniques | Farshid Farrokhnia, Donald Langler, Kenneth Scott Kump | 2002-12-03 |
| 6457861 | Method and apparatus for correcting electronic offset and gain variations in a solid state X-ray detector | Scott William Petrick, Swami Narasimhan | 2002-10-01 |