DL

Donald Langler

GE: 1 patents #935 of 2,640Top 40%
📍 Brookfield, WI: #26 of 64 inventorsTop 45%
🗺 Wisconsin: #910 of 3,225 inventorsTop 30%
Overall (2002): #227,856 of 266,432Top 90%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6488409 X-ray detector image quality test techniques Habib Vafi, Farshid Farrokhnia, Kenneth Scott Kump 2002-12-03