Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6502211 | Semiconductor memory testing apparatus | — | 2002-12-31 |
| 6502216 | Memory device testing apparatus | — | 2002-12-31 |
| 6449704 | Memory failure analysis device that records which regions have at least one defect | — | 2002-09-10 |
| 6374378 | Failure analysis memory for semiconductor memory testing devices and its storage method | Shinya Sato | 2002-04-16 |