SS

Shinya Sato

AD Advantest: 1 patents #49 of 141Top 35%
Overall (2002): #117,176 of 266,432Top 45%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6374378 Failure analysis memory for semiconductor memory testing devices and its storage method Katsuhiko Takano 2002-04-16