Issued Patents 2002
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6477264 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-11-05 |
| 6476909 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-11-05 |
| 6434263 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-08-13 |
| 6430310 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-08-06 |
| 6427023 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-07-30 |
| 6363165 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-03-26 |
| 6351554 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-02-26 |
| 6349145 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masato Hara, Masayuki Sugiura | 2002-02-19 |
| 6339683 | Standard measurement scale and markers for defining standard measurement scale | Toshihiro Nakayama, Atsumi Kaneko | 2002-01-15 |