Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6487517 | Target for photogrammetric analytical measurement system | Teruo Sakai | 2002-11-26 |
| 6339683 | Standard measurement scale and markers for defining standard measurement scale | Toshihiro Nakayama, Atsushi Kida | 2002-01-15 |