Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6434217 | System and method for analyzing layers using x-ray transmission | Bruce Lynn Pickelsimer | 2002-08-13 |
| 6406996 | Sub-cap and method of manufacture therefor in integrated circuit capping layers | Joffre F. Bernard, Minh Van Ngo | 2002-06-18 |
| 6376267 | Scattered incident X-ray photons for measuring surface roughness of a semiconductor topography | Brooke M. Noack | 2002-04-23 |