Issued Patents 2002
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6483327 | Quadrant avalanche photodiode time-resolved detection | Michael R. Bruce, Victoria J. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Brennan V. Davis | 2002-11-19 |
| 6483326 | Localized heating for defect isolation during die operation | Michael R. Bruce, Richard W. Johnson | 2002-11-19 |
| 6469529 | Time-resolved emission microscopy system | Michael R. Bruce, Glen Gilfeather | 2002-10-22 |
| 6455334 | Probe grid for integrated circuit analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Glen Gilfeather | 2002-09-24 |
| 6433572 | Intergrated circuit integrity analysis as a function of magnetic field decay | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-08-13 |
| 6430728 | Acoustic 3D analysis of circuit structures | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-08-06 |
| 6421811 | Defect detection via acoustic analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-07-16 |
| 6417680 | Method and apparatus for stress testing a semiconductor device using laser-induced circuit excitation | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-07-09 |
| 6414335 | Selective state change analysis of a SOI die | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone, Jeffrey D. Birdsley | 2002-07-02 |
| 6391664 | Selectively activatable solar cells for integrated circuit analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-05-21 |
| 6387715 | Integrated circuit defect detection via laser heat and IR thermography | Brennan V. Davis, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-05-14 |
| 6372529 | Forming elongated probe points useful in testing semiconductor devices | Rosalinda M. Ring, Brennan V. Davis, Jeffrey D. Birdsley, Michael R. Bruce | 2002-04-16 |
| 6352871 | Probe grid for integrated circuit excitation | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Glen Gilfeather | 2002-03-05 |
| 6350624 | Substrate removal as a functional of sonic analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-02-26 |