Issued Patents 2002
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6500699 | Test fixture for future integration | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-12-31 |
| 6488405 | Flip chip defect analysis using liquid crystal | David H. Eppes | 2002-12-03 |
| 6483327 | Quadrant avalanche photodiode time-resolved detection | Victoria J. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Rama R. Goruganthu, Brennan V. Davis | 2002-11-19 |
| 6483326 | Localized heating for defect isolation during die operation | Richard W. Johnson, Rama R. Goruganthu | 2002-11-19 |
| 6472760 | Nanomachining of integrated circuits | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring | 2002-10-29 |
| 6469529 | Time-resolved emission microscopy system | Rama R. Goruganthu, Glen Gilfeather | 2002-10-22 |
| 6455334 | Probe grid for integrated circuit analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Glen Gilfeather | 2002-09-24 |
| 6448096 | Atomic force microscopy and signal acquisition via buried insulator | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-09-10 |
| 6448095 | Circuit access and analysis for a SOI flip-chip die | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-09-10 |
| 6433572 | Intergrated circuit integrity analysis as a function of magnetic field decay | Jeffrey D. Birdsley, Rama R. Goruganthu, Brennan V. Davis, Rosalinda M. Ring | 2002-08-13 |
| 6430728 | Acoustic 3D analysis of circuit structures | Rama R. Goruganthu, Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring | 2002-08-06 |
| 6421811 | Defect detection via acoustic analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring | 2002-07-16 |
| 6417680 | Method and apparatus for stress testing a semiconductor device using laser-induced circuit excitation | Jeffrey D. Birdsley, Rama R. Goruganthu, Brennan V. Davis, Rosalinda M. Ring | 2002-07-09 |
| 6414335 | Selective state change analysis of a SOI die | Rama R. Goruganthu, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone, Jeffrey D. Birdsley | 2002-07-02 |
| 6410349 | Internal anti-reflective coating for interference reduction | Victoria J. Bruce, Gregory A. Dabney | 2002-06-25 |
| 6403388 | Nanomachining method for integrated circuits | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2002-06-11 |
| 6391664 | Selectively activatable solar cells for integrated circuit analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring | 2002-05-21 |
| 6387715 | Integrated circuit defect detection via laser heat and IR thermography | Brennan V. Davis, Rama R. Goruganthu, Jeffrey D. Birdsley, Rosalinda M. Ring | 2002-05-14 |
| 6375347 | Method for laser scanning flip-chip integrated circuits | Victoria J. Bruce | 2002-04-23 |
| 6372529 | Forming elongated probe points useful in testing semiconductor devices | Rosalinda M. Ring, Rama R. Goruganthu, Brennan V. Davis, Jeffrey D. Birdsley | 2002-04-16 |
| 6366101 | Method for laser analysis from the back side an electronic circuit formed on the front side of a semiconductor | — | 2002-04-02 |
| 6352871 | Probe grid for integrated circuit excitation | Rama R. Goruganthu, Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Glen Gilfeather | 2002-03-05 |
| 6350982 | Inducement and detection of latch-up using a laser scanning microscope | Victoria J. Bruce | 2002-02-26 |
| 6350624 | Substrate removal as a functional of sonic analysis | Rama R. Goruganthu, Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring | 2002-02-26 |