Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6446022 | Wafer fabrication system providing measurement data screening | Elfido Coss, Jr., Mike Simpson | 2002-09-03 |
| 6424876 | Statistical process control system with normalized control charting | James Sharier, Justin Giguere, Anatasia L. Oshelski | 2002-07-23 |