Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6417682 | Semiconductor device testing apparatus and its calibration method | Toshikazu Suzuki, Hiroyuki Nagai, Noriyoshi Kozuka, Yukio Ishigaki, Shigeru Matsumura +3 more | 2002-07-09 |
| 6400193 | High speed, high current and low power consumption output circuit | — | 2002-06-04 |