Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6469315 | Semiconductor device and method of manufacturing the same | Hideki Ono | 2002-10-22 |
| 6417682 | Semiconductor device testing apparatus and its calibration method | Hiroyuki Nagai, Noriyoshi Kozuka, Yukio Ishigaki, Shigeru Matsumura, Takashi Sekizuka +3 more | 2002-07-09 |