Issued Patents 1997
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5703680 | Method for dynamic interference pattern testing | John M. Maloney, Michael Hooper, Wayne David Maas | 1997-12-30 |
| 5638732 | Apparatus for cutting of elastomeric materials | Michael Becker, Klaus Beer, Daniel Ray Downing, James M. Hart, Dennis Alan Lundell | 1997-06-17 |
| 5610329 | Low-cost runout sensor with high frequency response and negligible stiction in the direction of travel | Albert James Yovichin, William Randall Dutt, Richard C. Houck, David D. Hyde, Raouf A. Ridha +1 more | 1997-03-11 |