CL

Chu-Mei Lee

TSMC: 1 patents #44 of 161Top 30%
📍 Luodong, TW: #2 of 4 inventorsTop 50%
Overall (1997): #167,789 of 185,788Top 95%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5633505 Semiconductor wafer incorporating marks for inspecting first layer overlay shift in global alignment process Wen-Jye Chung 1997-05-27