Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5694052 | Method and system for analysis and evaluation of semiconductor circuit performance characteristic | Toshitsugu Sawai | 1997-12-02 |
| 5677249 | Semiconductor apparatus and production method for the same | Masahiro Fukui, Mizuki Segawa, Michikazu Matsumoto | 1997-10-14 |