Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5631913 | Test circuit and test method of integrated semiconductor device | — | 1997-05-20 |
| 5598100 | Device for and method of evaluating semiconductor integrated circuit | Yukiharu Uraoka | 1997-01-28 |