Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5616916 | Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force | Keishi Kubo, Masateru Doi, Keiichi Yoshizumi | 1997-04-01 |