SW

Shunji Watanabe

NI Nikon: 2 patents #116 of 390Top 30%
Overall (1997): #23,994 of 185,788Top 15%
2
Patents 1997

Issued Patents 1997

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5689063 Atomic force microscope using cantilever attached to optical microscope Takamitsu Fujiu, Tatsushi Nomura, Yoshinori Sango, Toru Fujii, Tetsuo Hattori 1997-11-18
5679889 Method for extracting electrode and cantilever for AFM using said method for extracting electrode Tetsuo Hattori 1997-10-21