Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5629216 | Method for producing semiconductor wafers with low light scattering anomalies | Sandra A. Archer, Dinesh Gupta | 1997-05-13 |
| 5611855 | Method for manufacturing a calibration wafer having a microdefect-free layer of a precisely predetermined depth | — | 1997-03-18 |