Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5696717 | Nonvolatile integrated circuit memory devices having adjustable erase/program threshold voltage verification capability | — | 1997-12-09 |
| 5654925 | Circuit for applying a stress voltage in sequence to selected memory blocks in a semiconductor device | Young-Joon Choi | 1997-08-05 |