Issued Patents 1997
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5684748 | Circuit for testing reliability of chip and semiconductor memory device having the circuit | — | 1997-11-04 |
| 5677877 | Integrated circuit chips with multiplexed input/output pads and methods of operating same | Sei Seung Yoon | 1997-10-14 |
| 5677881 | Semiconductor memory device having a shortened test time and contol method therefor | Dong-Il Seo | 1997-10-14 |