Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5638331 | Burn-in test circuit and method in semiconductor memory device | Jei-Hwan Yoo | 1997-06-10 |
GC
Gi-Woon Cha
Overall (1997): #148,203 of 185,788Top 80%
1
Patents 1997