YK

Yasuhiro Kawata

AD Advantest: 1 patents #17 of 62Top 30%
📍 Anan, JP: #2 of 11 inventorsTop 20%
Overall (1997): #57,672 of 185,788Top 35%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5604756 Testing device for concurrently testing a plurality of semiconductor memories 1997-02-18